Michael Rybski

Michael brings more than 25 years of experience in leading multidisciplinary R&D groups throughout all lifecycle stages. Michael started his career at Applied Materials SEM division. He was Director of Product Development at Negevtech, developing an optical based wafer inspection system, VP of Product Development at Nova Measuring Instruments, developing wafer optical-based Critical Dimension Measurement systems, and in his last position, VP R&D at GreenOnyx, an Agtech company. Michael holds a BSc and MSc in Mechanical Engineering from the Technion, Israel.

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